Three-dimensional Characterization of Metallized Transitions in High-Voltage Inverter Components Phase II
Principal Investigator: Vyacheslav Solovyov, PhD
Industrial Partner: Technic Advanced Technology Division
Summary
Technic Advanced Technology Division (ATD) is conducting Phase II of a project to
investigate structural defects in high-voltage inverter components using focused-ion
beam (FIB) scanning electron microscopy. The project aims to develop a rapid method
for characterizing highly conductive metalized transitions (vias) and utilizes X-ray
diffraction and composition analysis at Brookhaven National Laboratory (BNL) to explore
these defects. The effort supports 3D integration in power electronics by addressing
performance limitations and enabling the integration of various power device technologies.
The CIEES team will image and analyze Technic’s samples, with ATD seeking a research
intern from CIEES-SBU for support.
Key Tasks
- Task 1: Development of Rapid-Access User Proposal & Imaging Standard Operating Procedure (SOP)
- Task 2: Sample Characterization
Economic Impacts
- Non-Government Funds: $200,000 (Technic ATD has secured non-federal monies for this phase).
- Increased Company Revenue: $500,000 (Technic expects increased revenue through products or services developed as a result of the engagement).
- Company Cost Savings: $50,000 (Cost savings attributed to the use of specialized facilities and expertise from CIEES vs. in-house or outsourced options).
- New Jobs Created in NY: 2 jobs created.
- Jobs Retained in NY: 2 jobs retained, which were in danger of being moved or cut.